Mohammed, Osman Khan
(2014)
Pre-edge analysis of X-rays absorption spectra in TiO2 modified films.
[Laurea magistrale], Università di Bologna, Corso di Studio in
Advanced spectroscopy in chemistry [LM-DM270], Documento ad accesso riservato.
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Abstract
The thesis is mainly focused on the pre-edge analysis of XAS spectra of Ti HCF sample hexacyanocobaltate and hexacyanoferrate samples doped on a Indium Tin Oxide (ITO) thin film. The work is aimed at the determination of Ti oxidation state, as well as indication of various coordination number in the studied samples. The experiment have been conducted using XAFS (X-ray absorption fine structure)beamline at Elettra synchrotron, Trieste (Italy)
under supervision of Professor Marco Giorgetti, Department of Industrial Chemistry, University of Bologna.
The Master thesis accreditation to fullfill the ASC Master of Advanced Spectroscopy in Chemistry Degree requirement.
Abstract
The thesis is mainly focused on the pre-edge analysis of XAS spectra of Ti HCF sample hexacyanocobaltate and hexacyanoferrate samples doped on a Indium Tin Oxide (ITO) thin film. The work is aimed at the determination of Ti oxidation state, as well as indication of various coordination number in the studied samples. The experiment have been conducted using XAFS (X-ray absorption fine structure)beamline at Elettra synchrotron, Trieste (Italy)
under supervision of Professor Marco Giorgetti, Department of Industrial Chemistry, University of Bologna.
The Master thesis accreditation to fullfill the ASC Master of Advanced Spectroscopy in Chemistry Degree requirement.
Tipologia del documento
Tesi di laurea
(Laurea magistrale)
Autore della tesi
Mohammed, Osman Khan
Relatore della tesi
Scuola
Corso di studio
Parole chiave
XANES TiO2 pre-edge analysis ITO substrate, beamline Elettra
Data di discussione della Tesi
25 Luglio 2014
URI
Altri metadati
Tipologia del documento
Tesi di laurea
(NON SPECIFICATO)
Autore della tesi
Mohammed, Osman Khan
Relatore della tesi
Scuola
Corso di studio
Parole chiave
XANES TiO2 pre-edge analysis ITO substrate, beamline Elettra
Data di discussione della Tesi
25 Luglio 2014
URI
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