Design, verification and implementation of a non-volatile memory BIST

The main topic of this Thesis is the implementation of a Memory Built-In Self Test (MBIST) which tests a nonvolatile OTP (One-Time Programmable) memory to prove its basic functionalities before burning it. This new IP is meant to be suitable for integration in all products which embed the type of memory targeted by the MBIST. The MBIST reduces the test time from 12 s to 13.443 ms for the largest memory, and from 2.5 s to 5.2 ms for the smallest one. Moreover, it is adaptable to any memory size and its timing constraints can be automatically adjusted to any clock frequency. As a use case, the MBIST has been developed targeting a specific project, a switch LED-matrix manager with constant current regulation and integrated buck-boost controller for automotive headlight applications.